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On-Line Analysis of Stuck-at Faults in On-Chip Network Interconnects

On-Line Analysis of Stuck-at Faults in On-Chip Network Interconnects

Bhowmik, Biswajit; Deka, Jatindra Kumar; Biswas, Santosh
  • 期刊名称Journal of Circuits, Systems and Computers
  • 作者Bhowmik, Biswajit; Deka, Jatindra Kumar; Biswas, Santosh
  • 印刷ISSN0218-1266
  • 电子ISSN1793-6454
  • 文件大小626.69KB
  • 发表时间2018-03-06
  • DOI10.1142/S0218126618502031
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