Reliability-Aware Test Methodology for Detecting Short-Channel Faults in On-Chip Networks
- 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- 作者Bhowmik, Biswajit; Biswas, Santosh; Deka, Jatindra Kumar; Bhattacharya, Bhargab B.
- 印刷ISSN1063-8210
- 电子ISSN1557-9999
- 文件大小3762.25KB
- 发表时间2018
- DOI10.1109/TVLSI.2018.2803478
- 页码1-14
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