Atomic Scale Modulation of Self-Rectifying Resistive Switching by Interfacial Defects

• 期刊名称Advanced Science
• 作者Wu, Xing; Yu, Kaihao; Cha, Dongkyu; Bosman, Michel; Raghavan, Nagarajan; Zhang, Xixiang; Li, Kun; Liu, Qi; Sun, Litao; Pey, Kinleong
• 印刷ISSN2198-3844
• 文件大小2901.38KB
• 发表时间2018-04-14
• DOI10.1002/advs.201800096