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Interference-Enhanced Broadband Absorption of Monolayer MoS
<sub/>2</sub>
on Sub-100 nm Thick SiO
<sub/>2</sub>
/Si Substrates: Reflection and Transmission Phase Changes at Interfaces

Interference-Enhanced Broadband Absorption of Monolayer MoS ₂ on Sub-100 nm Thick SiO ₂ /Si Substrates: Reflection and Transmission Phase Changes at Interfaces

Kim, Eunah; Cho, Jin-Woo; Kim, Bo Ra; Nguyen, Trang Thi Thu; Nam, Yoon-Ho; Kim, Sun-Kyung; Yoon, Seokhyun; Kim, Yong Soo; Lee, Jung-Ho; Kim, Dong-Wook

期刊名称Advanced Materials Interfaces
作者Kim, Eunah; Cho, Jin-Woo; Kim, Bo Ra; Nguyen, Trang Thi Thu; Nam, Yoon-Ho; Kim, Sun-Kyung; Yoon, Seokhyun; Kim, Yong Soo; Lee, Jung-Ho; Kim, Dong-Wook
印刷ISSN2196-7350
文件大小897.27KB
发表时间2018-04-16
DOI10.1002/admi.201701637

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