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[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Weibull cumulative distribution function (CDF) analysis with life expectancy endurance test result of power window switch

[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Weibull cumulative distribution function (CDF) analysis with life expectancy endurance test result of power window switch

Lee, Miky; Kim, K.; Lim, D.; Cho, D.; Han, Ck.

作者Lee, Miky; Kim, K.; Lim, D.; Cho, D.; Han, Ck.
文件大小2724.14KB
发表时间2018
DOI10.1109/IRPS.2018.8353694

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