[IEEE 2018 IEEE 36th VLSI Test Symposium (VTS) - San Francisco, CA, USA (2018.4.22-2018.4.25)] 2018 IEEE 36th VLSI Test Symposium (VTS) - A coherent subsampling test system arrangement suitable for phase domain measurements

• 作者Cho, Young Gouk; Roberts, Gordon W.; Aouini, Sadok; Parvizi, Mahdi; Ben-Hamida, Naim
• 文件大小520.45KB
• 发表时间2018
• DOI10.1109/vts.2018.8368621
• 页码1-6