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[IEEE 2018 7th International Conference on Modern Circuits and Systems Technologies (MOCAST) - Thessaloniki, Greece (2018.5.7-2018.5.9)] 2018 7th International Conference on Modern Circuits and Systems Technologies (MOCAST) - Elements for upset hardened associative memories

[IEEE 2018 7th International Conference on Modern Circuits and Systems Technologies (MOCAST) - Thessaloniki, Greece (2018.5.7-2018.5.9)] 2018 7th International Conference on Modern Circuits and Systems Technologies (MOCAST) - Elements for upset hardened associative memories

Katunin, Yury V.; Stenin, Vladimir Ya.

作者Katunin, Yury V.; Stenin, Vladimir Ya.
文件大小743.63KB
发表时间2018
DOI10.1109/MOCAST.2018.8376595
页码1-4

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