[ACM Press the 55th Annual Design Automation Conference - San Francisco, California (2018.06.24-2018.06.29)] Proceedings of the 55th Annual Design Automation Conference on - DAC '18 - Application level hardware tracing for scaling post-silicon debug

• 作者Pal, Debjit; Sharma, Abhishek; Ray, Sandip; de Paula, Flavio M.; Vasudevan, Shobha
• 文件大小1440.46KB
• 发表时间2018
• DOI10.1145/3195970.3195992
• 页码1-6