Exponential-Dispersion Degradation Process Models With Random Effects and Covariates
Duan, Fengjun; Wang, Guanjun
- 期刊名称IEEE Transactions on Reliability
- 作者Duan, Fengjun; Wang, Guanjun
- 印刷ISSN0018-9529
- 电子ISSN1558-1721
- 文件大小1666.18KB
- 发表时间2018
- DOI10.1109/TR.2018.2849087
- 页码1-15