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Insight into the dynamics of electrons ejected by energetic ions in silicon and its relation to the basics of the inelastic thermal spike model

Insight into the dynamics of electrons ejected by energetic ions in silicon and its relation to the basics of the inelastic thermal spike model

Akkerman, Avraham; Murat, Michael; Barak, Joseph
  • 期刊名称Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  • 作者Akkerman, Avraham; Murat, Michael; Barak, Joseph
  • 卷第432卷
  • 印刷ISSN0168-583X
  • 文件大小567.06KB
  • 发表时间2018-10
  • DOI10.1016/j.nimb.2018.07.009
  • 页码29-36
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