[IEEE 2018 Annual American Control Conference (ACC) - Milwaukee, WI, USA (2018.6.27-2018.6.29)] 2018 Annual American Control Conference (ACC) - Sensor Selection for Fault Detection and Isolation in Structurally Reconfigurable Systems
Deosthale, Eeshan; Jung, Daniel; Ahmed, Qadeer
- 作者Deosthale, Eeshan; Jung, Daniel; Ahmed, Qadeer
- 文件大小310.10KB
- 发表时间2018
- DOI10.23919/ACC.2018.8430950
- 页码5807-5812