Aluminum Electrode Insulation Dynamics via Interface Oxidation by Reactant Diffusion in Organic Layers

Fluhr, Daniel; Züfle, Simon; Muhsin, Burhan; Öttking, Rolf; Seeland, Marco; Roesch, Roland; Schubert, Ulrich S.; Ruhstaller, Beat; Krischok, Stefan; Hoppe, Harald

期刊名称physica status solidi (a)
作者Fluhr, Daniel; Züfle, Simon; Muhsin, Burhan; Öttking, Rolf; Seeland, Marco; Roesch, Roland; Schubert, Ulrich S.; Ruhstaller, Beat; Krischok, Stefan; Hoppe, Harald
印刷ISSN1862-6300
文件大小2154.98KB
发表时间2018-08-26
DOI10.1002/pssa.201800474

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Aluminum Electrode Insulation Dynamics via Interface Oxidation by Reactant Diffusion in Organic Layers