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Subnanometer localization accuracy in widefield optical microscopy

Copeland, Craig R.; Geist, Jon; McGray, Craig D.; Aksyuk, Vladimir A.; Liddle, J. Alexander; Ilic, B. Robert; Stavis, Samuel M.

期刊名称Light: Science & Applications
作者Copeland, Craig R.; Geist, Jon; McGray, Craig D.; Aksyuk, Vladimir A.; Liddle, J. Alexander; Ilic, B. Robert; Stavis, Samuel M.
卷第7卷
期第1期
电子ISSN2047-7538
文件大小3463.91KB
发表时间2018-12
DOI10.1038/s41377-018-0031-z