Challenges and Opportunities with Highly Brilliant X-ray Sources for multi-Modal in-Situ and Operando Characterization of Solar Cells

Stuckelberger, M. E.; Nietzold, T.; West, B. M.; Walker, T.; Ossig, C.; Kahnt, M.; Wittwer, F.; Deng, J.; Maser, J. M.; Lai, B.; Cai, Z.; Rose, V.; Ulvestad, A.; Holt, M. V.; Hruszkewycz, S.; Dynes, J. J.; Wang, J.; Salomon, D.; Tucoulou, R.; Huang, X.; Yan, H.; Nazaretski, E.; Chu, Y. S.; Schroer, C. G.; Bertoni, M. I.

期刊名称Microscopy and Microanalysis
作者Stuckelberger, M. E.; Nietzold, T.; West, B. M.; Walker, T.; Ossig, C.; Kahnt, M.; Wittwer, F.; Deng, J.; Maser, J. M.; Lai, B.; Cai, Z.; Rose, V.; Ulvestad, A.; Holt, M. V.; Hruszkewycz, S.; Dynes, J. J.; Wang, J.; Salomon, D.; Tucoulou, R.; Huang, X.; Yan, H.; Nazaretski, E.; Chu, Y. S.; Schroer, C. G.; Bertoni, M. I.
卷第24卷
印刷ISSN1431-9276
电子ISSN1435-8115
文件大小937.53KB
发表时间2018-08
DOI10.1017/S1431927618014423
页码434-435

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Challenges and Opportunities with Highly Brilliant X-ray Sources for multi-Modal in-Situ and Operando Characterization of Solar Cells