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Planning of step-stress accelerated degradation test based on non-stationary gamma process with random effects

Planning of step-stress accelerated degradation test based on non-stationary gamma process with random effects

Duan, Fengjun; Wang, Guanjun
  • 期刊名称Computers & Industrial Engineering
  • 作者Duan, Fengjun; Wang, Guanjun
  • 卷第125卷
  • 印刷ISSN0360-8352
  • 文件大小1109.25KB
  • 发表时间2018-11
  • DOI10.1016/j.cie.2018.09.003
  • 页码467-479
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