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Conducted EMI evolution of power SiC MOSFET in a Buck converter after short-circuit aging tests

Douzi, Shawki; Kadi, Moncef; Boulzazen, Habib; Tlig, Mohamed; Ben Hadj Slama, Jaleleddine

期刊名称Microelectronics Reliability
作者Douzi, Shawki; Kadi, Moncef; Boulzazen, Habib; Tlig, Mohamed; Ben Hadj Slama, Jaleleddine
印刷ISSN0026-2714
文件大小857.53KB
发表时间2018-09
DOI10.1016/j.microrel.2018.06.092
页码219-224