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A comparative ab initio study of the structural, mechanical, electronic and optical behaviors of ZnO:Ni thin films with nanometer scale

A comparative ab initio study of the structural, mechanical, electronic and optical behaviors of ZnO:Ni thin films with nanometer scale

Ziabari, Ali Abdolahzadeh; Mousavi, S.J.; Ahmadi, M.H.
  • 期刊名称Chinese Journal of Physics
  • 作者Ziabari, Ali Abdolahzadeh; Mousavi, S.J.; Ahmadi, M.H.
  • 印刷ISSN0577-9073
  • 文件大小1802.63KB
  • 发表时间2018-12
  • DOI10.1016/j.cjph.2018.12.012
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