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[IEEE 2018 IEEE East-West Design & Test Symposium (EWDTS) - Kazan (2018.9.14-2018.9.17)] 2018 IEEE East-West Design & Test Symposium (EWDTS) - Pseudo-Exhaustive Random Access Memory Testing Based on March Tests with Random Background Variation

[IEEE 2018 IEEE East-West Design & Test Symposium (EWDTS) - Kazan (2018.9.14-2018.9.17)] 2018 IEEE East-West Design & Test Symposium (EWDTS) - Pseudo-Exhaustive Random Access Memory Testing Based on March Tests with Random Background Variation

Mrozek, Ireneusz; Yarmolik, Vyacheslav

作者Mrozek, Ireneusz; Yarmolik, Vyacheslav
文件大小165.59KB
发表时间2018
DOI10.1109/ewdts.2018.8524824
页码1-8

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