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[IEEE 2018 25th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD) - Kyoto, Japan (2018.7.3-2018.7.6)] 2018 25th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD) - Characteristic Evaluation of Ga-Sn-O Thin Films by Hall Measurement

[IEEE 2018 25th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD) - Kyoto, Japan (2018.7.3-2018.7.6)] 2018 25th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD) - Characteristic Evaluation of Ga-Sn-O Thin Films by Hall Measurement

Imanishi, Kota; Fukawa, Asuka; Matsuda, Tokiyoshi; Kimura, Mutsumi

作者Imanishi, Kota; Fukawa, Asuka; Matsuda, Tokiyoshi; Kimura, Mutsumi
文件大小5.62KB
发表时间2018
DOI10.23919/AM-FPD.2018.8437427
页码1-3

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