Total photoelectron yield spectroscopy of energy distribution of electronic states density at GaN surface and SiO
2
/GaN interface
Ohta, Akio; Truyen, Nguyen Xuan; Fujimura, Nobuyuki; Ikeda, Mitsuhisa; Makihara, Katsunori; Miyazaki, Seiichi
- 期刊名称Japanese Journal of Applied Physics
- 作者Ohta, Akio; Truyen, Nguyen Xuan; Fujimura, Nobuyuki; Ikeda, Mitsuhisa; Makihara, Katsunori; Miyazaki, Seiichi
- 卷第57卷
- 印刷ISSN0021-4922
- 电子ISSN1347-4065
- 文件大小2849.32KB
- 发表时间2018-06-01
- DOI10.7567/JJAP.57.06KA08