[IEEE 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) - Singapore (2018.5.14-2018.5.18)] 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) - Systematic analysis of ESD-induced soft-failures as a function of operating conditions
Izadi, Omid Hoseini; Hosseinbeig, Ahmad; Pommerenke, David; Shumiya, Hideki; Maeshima, Junji; Araki, Kenji
- 作者Izadi, Omid Hoseini; Hosseinbeig, Ahmad; Pommerenke, David; Shumiya, Hideki; Maeshima, Junji; Araki, Kenji
- 文件大小1096.08KB
- 发表时间2018
- DOI10.1109/isemc.2018.8393784
- 页码286-291