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[IEEE 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) - Singapore (2018.5.14-2018.5.18)] 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) - Systematic analysis of ESD-induced soft-failures as a function of operating conditions

[IEEE 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) - Singapore (2018.5.14-2018.5.18)] 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) - Systematic analysis of ESD-induced soft-failures as a function of operating conditions

Izadi, Omid Hoseini; Hosseinbeig, Ahmad; Pommerenke, David; Shumiya, Hideki; Maeshima, Junji; Araki, Kenji
  • 作者Izadi, Omid Hoseini; Hosseinbeig, Ahmad; Pommerenke, David; Shumiya, Hideki; Maeshima, Junji; Araki, Kenji
  • 文件大小1096.08KB
  • 发表时间2018
  • DOI10.1109/isemc.2018.8393784
  • 页码286-291
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