[IEEE 2018 IEEE 2nd International Conference on Dielectrics (ICD) - Budapest (2018.7.1-2018.7.5)] 2018 IEEE 2nd International Conference on Dielectrics (ICD) - Risk Assessment of Free Metal Particles in DC GIL
Chang, Yanan; Wang, Jingrui; Ni, Xiaoru; Wang, Jian; Li, Qingmin
- 作者Chang, Yanan; Wang, Jingrui; Ni, Xiaoru; Wang, Jian; Li, Qingmin
- 文件大小266.31KB
- 发表时间2018
- DOI10.1109/ICD.2018.8514720
- 页码1-4