Structural and ferroelectric properties of P(VDF-TrFE) thin films depending on the annealing temperature
- 期刊名称Materials Letters
- 作者Seo, Jeongdae; Son, Jong Yeog; Kim, Woo-Hee
- 卷第238卷
- 印刷ISSN0167-577X
- 文件大小1776.66KB
- 发表时间2019-03
- DOI10.1016/j.matlet.2018.11.156
- 页码294-297
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