Performance-Aware Test Scheduling for Diagnosing Coexistent Channel Faults in Topology-Agnostic Networks-on-Chip

• 期刊名称ACM Transactions on Design Automation of Electronic Systems
• 作者Bhowmik, Biswajit; Deka, Jatindra Kumar; Biswas, Santosh; Bhattacharya, Bhargab B.
• 卷第24卷
• 期第2期
• 印刷ISSN1084-4309
• 文件大小1568.72KB
• 发表时间2019-01-10
• DOI10.1145/3291532
• 页码1-29