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Determination of DC equivalent hot carrier stress times in scaled CMOS devices using novel AC stress methodology

Determination of DC equivalent hot carrier stress times in scaled CMOS devices using novel AC stress methodology

Kerber, Andreas; Nigam, Tanya

期刊名称Microelectronics Reliability
作者Kerber, Andreas; Nigam, Tanya
卷第93卷
印刷ISSN0026-2714
文件大小1455.30KB
发表时间2019-02
DOI10.1016/j.microrel.2018.12.012
页码98-101

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