New Worst-Case Timing for Standard Cells under Aging Effects
- 期刊名称IEEE Transactions on Device and Materials Reliability
- 作者van Santen, Victor M.; Amrouch, Hussam; Henkel, Jorg
- 印刷ISSN1530-4388
- 电子ISSN1558-2574
- 文件大小5.31KB
- 发表时间2019
- DOI10.1109/TDMR.2019.2893017
- 页码1-1
[IEEE 2018 31st IEEE International System-on-Chip Conference (SOCC) - Arlington, VA, USA (2018.9.4-2018.9.7)] 2018 31st IEEE International System-on-Chip Conference (SOCC) - 2018 31th IEEE International System-on-Chip Conference (SOCC)2018
[IEEE 2018 31st IEEE International System-on-Chip Conference (SOCC) - Arlington, VA, USA (2018.9.4-2018.9.7)] 2018 31st IEEE International System-on-Chip Conference (SOCC) - 31st IEEE International System on Chip Conference (SOCC)2018
[IEEE 2018 IEEE International Conference on Applied System Innovation (ICASI) - Chiba, Japan (2018.4.13-2018.4.17)] 2018 IEEE International Conference on Applied System Invention (ICASI) - Conference Agenda2018
[IEEE 2018 31st IEEE International System-on-Chip Conference (SOCC) - Arlington, VA, USA (2018.9.4-2018.9.7)] 2018 31st IEEE International System-on-Chip Conference (SOCC) - IEEE International SOC Conference2018
[IEEE 2018 IEEE International Conference on Applied System Innovation (ICASI) - Chiba, Japan (2018.4.13-2018.4.17)] 2018 IEEE International Conference on Applied System Invention (ICASI) - [Front cover]2018
[IEEE 2018 IEEE International Conference on Applied System Innovation (ICASI) - Chiba, Japan (2018.4.13-2018.4.17)] 2018 IEEE International Conference on Applied System Invention (ICASI) - Author index2018
[IEEE 2018 IEEE International Conference on Applied System Innovation (ICASI) - Chiba, Japan (2018.4.13-2018.4.17)] 2018 IEEE International Conference on Applied System Invention (ICASI) - [Copyright notice]2018
[IEEE 2018 IEEE International Conference on Applied System Innovation (ICASI) - Chiba, Japan (2018.4.13-2018.4.17)] 2018 IEEE International Conference on Applied System Invention (ICASI) - Table of content2018