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A configurational analysis of the termination scenarios of international joint ventures: All is well that ends well

A configurational analysis of the termination scenarios of international joint ventures: All is well that ends well

Ott, Ursula F.; Williams, David; Saker, James; Staley, Lee
  • 期刊名称Journal of Innovation & Knowledge
  • 作者Ott, Ursula F.; Williams, David; Saker, James; Staley, Lee
  • 印刷ISSN2444-569X
  • 文件大小854.22KB
  • 发表时间2019-2
  • DOI10.1016/j.jik.2019.01.004
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