A configurational analysis of the termination scenarios of international joint ventures: All is well that ends well
Ott, Ursula F.; Williams, David; Saker, James; Staley, Lee
- 期刊名称Journal of Innovation & Knowledge
- 作者Ott, Ursula F.; Williams, David; Saker, James; Staley, Lee
- 印刷ISSN2444-569X
- 文件大小854.22KB
- 发表时间2019-2
- DOI10.1016/j.jik.2019.01.004