Modeling the Interdependences Between Voltage Fluctuation and BTI Aging
- 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- 作者Salamin, Sami; van Santen, Victor M.; Amrouch, Hussam; Parihar, Narendra; Mahapatra, Souvik; Henkel, Jorg
- 印刷ISSN1063-8210
- 电子ISSN1557-9999
- 文件大小11.32KB
- 发表时间2019
- DOI10.1109/TVLSI.2019.2899890
- 页码1-14
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