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[IEEE 2019 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Saint Petersburg and Moscow, Russia (2019.1.28-2019.1.31)] 2019 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - The Model of Assessing Economic Efficiency of Biometric ATMs

[IEEE 2019 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Saint Petersburg and Moscow, Russia (2019.1.28-2019.1.31)] 2019 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - The Model of Assessing Economic Efficiency of Biometric ATMs

Bataev, Alexey V.

作者Bataev, Alexey V.
文件大小7.97KB
发表时间2019
DOI10.1109/EIConRus.2019.8657319
页码1365-1370

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