A Low-Cost Test Solution for Reliable Communication in Networks-on-Chip
- 期刊名称Journal of Electronic Testing
- 作者Bhowmik, Biswajit; Biswas, Santosh; Deka, Jatindra Kumar; Bhattacharya, Bhargab B.
- 印刷ISSN0923-8174
- 电子ISSN1573-0727
- 文件大小3371.08KB
- 发表时间2019-5-2
- DOI10.1007/s10836-019-05792-1
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