An Accurate Calorimetric Loss Measurement Method for SiC MOSFETs
Anurag, Anup; Acharya, Sayan; Bhattacharya, Subhashish
- 期刊名称IEEE Journal of Emerging and Selected Topics in Power Electronics
- 作者Anurag, Anup; Acharya, Sayan; Bhattacharya, Subhashish
- 印刷ISSN2168-6777
- 电子ISSN2168-6785
- 文件大小15383.34KB
- 发表时间2019
- DOI10.1109/JESTPE.2019.2920935
- 页码1-1