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An Accurate Calorimetric Loss Measurement Method for SiC MOSFETs

An Accurate Calorimetric Loss Measurement Method for SiC MOSFETs

Anurag, Anup; Acharya, Sayan; Bhattacharya, Subhashish
  • 期刊名称IEEE Journal of Emerging and Selected Topics in Power Electronics
  • 作者Anurag, Anup; Acharya, Sayan; Bhattacharya, Subhashish
  • 印刷ISSN2168-6777
  • 电子ISSN2168-6785
  • 文件大小15383.34KB
  • 发表时间2019
  • DOI10.1109/JESTPE.2019.2920935
  • 页码1-1
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