Indium Diffusion Behavior and Application in HfO
<sub/>2</sub>
‐based Conductive Bridge Random Access Memory

Indium Diffusion Behavior and Application in HfO ₂ ‐based Conductive Bridge Random Access Memory

Zheng, Hao-Xuan; Shih, Chih-Cheng; Chang, Ting-Chang; Shih, Lin-Yi; Shih, Yao-Kai; Tseng, Yi-Ting; Chen, Wen-Chung; Huang, Wei-Chen; Yang, Chih-Cheng; Wu, Pei-Yu; Huang, Hui-Chun; Tsai, Tsung-Ming; Sze, Simon M.

期刊名称physica status solidi (RRL) – Rapid Research Letters
作者Zheng, Hao-Xuan; Shih, Chih-Cheng; Chang, Ting-Chang; Shih, Lin-Yi; Shih, Yao-Kai; Tseng, Yi-Ting; Chen, Wen-Chung; Huang, Wei-Chen; Yang, Chih-Cheng; Wu, Pei-Yu; Huang, Hui-Chun; Tsai, Tsung-Ming; Sze, Simon M.
印刷ISSN1862-6254
电子ISSN1862-6270
文件大小867.33KB
发表时间2019-07-30
DOI10.1002/pssr.201900285

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Indium Diffusion Behavior and Application in HfO 2 ‐based Conductive Bridge Random Access Memory

Indium Diffusion Behavior and Application in HfO ₂ ‐based Conductive Bridge Random Access Memory