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[NanoScience and Technology] Electrical Atomic Force Microscopy for Nanoelectronics || Space Charge at Nanoscale: Probing Injection and Dynamic Phenomena Under Dark/Light Configurations by Using KPFM and C-AFM

[NanoScience and Technology] Electrical Atomic Force Microscopy for Nanoelectronics || Space Charge at Nanoscale: Probing Injection and Dynamic Phenomena Under Dark/Light Configurations by Using KPFM and C-AFM

Celano, Umberto

作者Celano, Umberto
文件大小1123.26KB
发表时间2019
DOI10.1007/978-3-030-15612-1_9
页码267-301

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