Measurement Techniques to Identify Soft Failure Sensitivity to ESD

Zhou, Jianchi; Guo, Yuandong; Shinde, Satyajeet; Hosseinbeig, Ahmad; Patnaik, Abhishek; Izadi, Omid Hoseini; Zeng, Chen; Shi, Jun; Maeshima, Junji; Shumiya, Hideki; Araki, Kenji; Pommerenke, David J.

期刊名称IEEE Transactions on Electromagnetic Compatibility
作者Zhou, Jianchi; Guo, Yuandong; Shinde, Satyajeet; Hosseinbeig, Ahmad; Patnaik, Abhishek; Izadi, Omid Hoseini; Zeng, Chen; Shi, Jun; Maeshima, Junji; Shumiya, Hideki; Araki, Kenji; Pommerenke, David J.
印刷ISSN0018-9375
电子ISSN1558-187X
文件大小41.65KB
发表时间2019
DOI10.1109/TEMC.2019.2926962
页码1-10

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Measurement Techniques to Identify Soft Failure Sensitivity to ESD