[IEEE 2019 IEEE European Test Symposium (ETS) - Baden-Baden, Germany (2019.5.27-2019.5.31)] 2019 IEEE European Test Symposium (ETS) - Test Pattern Generator for Majority Voter based QCA Combinational Circuits targeting MMC Defect
- 作者Dhare, Vaishali; Mehta, Usha
- 文件大小368.69KB
- 发表时间2019
- DOI10.1109/ETS.2019.8791514
- 页码1-2
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