[IEEE 2019 IEEE/ACM 7th International Workshop on Realizing Artificial Intelligence Synergies in Software Engineering (RAISE) - Montreal, QC, Canada (2019.5.28-2019.5.28)] 2019 IEEE/ACM 7th International Workshop on Realizing Artificial Intelligence Synergies in Software Engineering (RAISE) - An Explainable Deep Model for Defect Prediction
- 作者Humphreys, Jack; Dam, Hoa Khanh
- 文件大小338.84KB
- 发表时间2019
- DOI10.1109/RAISE.2019.00016
- 页码49-55
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