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Electron-Excited X-ray Microanalysis by Energy Dispersive Spectrometry at 50: Analytical Accuracy, Precision, Trace Sensitivity, and Quantitative Compositional Mapping

Electron-Excited X-ray Microanalysis by Energy Dispersive Spectrometry at 50: Analytical Accuracy, Precision, Trace Sensitivity, and Quantitative Compositional Mapping

Newbury, Dale E.; Ritchie, Nicholas W.M.

期刊名称Microscopy and Microanalysis
作者Newbury, Dale E.; Ritchie, Nicholas W.M.
印刷ISSN1431-9276
电子ISSN1435-8115
文件大小3153.08KB
发表时间2019-8-23
DOI10.1017/S143192761901482X
页码1-31

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