In situ
Probing of Nanostructure Surfaces
Hansen, Thomas W.; Nielsen, Monia R.; Liu, Pei; Schlexer, Philomena; Madsen, Jacob; Andersen, Anton B.; Schiøtz, Jakob; Sebok, Bela; Chorkendorff, Ib; Wagner, Jakob B.
- 期刊名称Microscopy and Microanalysis
- 作者Hansen, Thomas W.; Nielsen, Monia R.; Liu, Pei; Schlexer, Philomena; Madsen, Jacob; Andersen, Anton B.; Schiøtz, Jakob; Sebok, Bela; Chorkendorff, Ib; Wagner, Jakob B.
- 卷第25卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小922.43KB
- 发表时间2019-08
- DOI10.1017/s1431927619011139
- 页码2080-2081