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SM-6 Thorough quantification of micrograph by AI and advanced mathematics

SM-6 Thorough quantification of micrograph by AI and advanced mathematics

Adachi, Yoshitaka; Ogawa, Toshio; Wang, Zhi-Lei; Enya, Kohei; Ajioka, Fumito
  • 期刊名称Microscopy
  • 作者Adachi, Yoshitaka; Ogawa, Toshio; Wang, Zhi-Lei; Enya, Kohei; Ajioka, Fumito
  • 卷第68卷
  • 印刷ISSN2050-5698
  • 电子ISSN2050-5701
  • 文件大小253.92KB
  • 发表时间2019-11-01
  • DOI10.1093/jmicro/dfz059
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