An Automatic Test Pattern Generation Method for Multiple Stuck-at Faults by Incrementally Extending the Test Patterns
- 期刊名称IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- 作者Wang, Peikun; Gharehbaghi, Amir Masoud; Fujita, Masahiro
- 印刷ISSN0278-0070
- 电子ISSN1937-4151
- 文件大小1311.31KB
- 发表时间2019
- DOI10.1109/TCAD.2019.2957364
- 页码1-1
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