Tweedie Exponential Dispersion Processes for Degradation Modeling, Prognostic, and Accelerated Degradation Test Planning

• 期刊名称IEEE Transactions on Reliability
• 作者Chen, Zhen; Xia, Tangbin; Li, Yanting; Pan, Ershun
• 印刷ISSN0018-9529
• 电子ISSN1558-1721
• 文件大小5073.51KB
• 发表时间2019
• DOI10.1109/TR.2019.2955596
• 页码1-16