[IEEE 2019 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) - Bangkok, Thailand (2019.11.11-2019.11.14)] 2019 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) - Simplified Variable Node Unit Architecture for Nonbinary LDPC Decoder
- 作者Pham Thi, Huyen; Dinh The, Cuong; Pham Xuan, Nghia; Dao Tuan, Hung; Lee, Hanho
- 文件大小1744.34KB
- 发表时间2019
- DOI10.1109/APCCAS47518.2019.8953111
- 页码213-216
[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Reviewers2019
[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Acknowledgements2019
[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Copyright Page2019
[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Title Page iii2019
[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Table of Contents2019
[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Publisher's Information2019
[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Title Page i2019
[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Test-Driven Anonymization for Artificial IntelligenceAugusto, Cristian; Moran, Jesus; De La Riva, Claudio; Tuya, Javier · 2019