[IEEE 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Grenoble, France (2019.4.1-2019.4.3)] 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Low Temperature Electrical Characteristics of Si Nanonet Field Effect Transistors
Cazimajou, T.; Legallais, M.; Nguyen, T.T.T.; Mouis, M.; Ternon, C.; Salem, B.; Ghibaudo, G.
- 作者Cazimajou, T.; Legallais, M.; Nguyen, T.T.T.; Mouis, M.; Ternon, C.; Salem, B.; Ghibaudo, G.
- 文件大小1168.99KB
- 发表时间2019
- DOI10.1109/eurosoi-ulis45800.2019.9041882
- 页码1-4