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Optimal degradation-based burn-in policy using Tweedie exponential-dispersion process model with measurement errors

Optimal degradation-based burn-in policy using Tweedie exponential-dispersion process model with measurement errors

Chen, Zhen; Pan, Ershun; Xia, Tangbin; Li, Yanting
  • 期刊名称Reliability Engineering & System Safety
  • 作者Chen, Zhen; Pan, Ershun; Xia, Tangbin; Li, Yanting
  • 卷第195卷
  • 印刷ISSN0951-8320
  • 文件大小1348.73KB
  • 发表时间2020-03
  • DOI10.1016/j.ress.2019.106748
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