Optimal degradation-based burn-in policy using Tweedie exponential-dispersion process model with measurement errors
Chen, Zhen; Pan, Ershun; Xia, Tangbin; Li, Yanting
- 期刊名称Reliability Engineering & System Safety
- 作者Chen, Zhen; Pan, Ershun; Xia, Tangbin; Li, Yanting
- 卷第195卷
- 印刷ISSN0951-8320
- 文件大小1348.73KB
- 发表时间2020-03
- DOI10.1016/j.ress.2019.106748