On the effect of the measurement error on Shewhart t and EWMA t control charts
- 期刊名称The International Journal of Advanced Manufacturing Technology
- 作者Nguyen, Huu Du; Tran, Kim Phuc; Celano, Giovanni; Maravelakis, Petros E.; Castagliola, Philippe
- 卷第107卷
- 印刷ISSN0268-3768
- 电子ISSN1433-3015
- 文件大小760.53KB
- 发表时间2020-4
- DOI10.1007/s00170-020-05222-z
- 页码4317-4332
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