![[IEEE 2010 21st Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - San Francisco, CA, USA (2010.07.11-2010.07.13)] 2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Device-design metrics to improve manufacturability]()
[IEEE 2010 21st Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - San Francisco, CA, USA (2010.07.11-2010.07.13)] 2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Device-design metrics to improve manufacturabilityPeterson, Kirk; Logan, Ron; Yu, Xiaojun; Dezfulian, Kevin; Bazan, Greg; Winslow, Jon; Zamdmer, Noah; Dubuque, Lenny; Walsh, Brian; Norfleet, Andrew; Clougherty, Fran; Bayat, Ben; Mocuta, Anda; Rim, Ken · 2010