![SPIE Proceedings [SPIE 30th Annual Technical Symposium - San Diego (Friday 1 August 1986)] X-Rays in Materials Analysis: Novel Applications and Recent Developments - <title>Measurement of X-Ray Dielectric Constants With Coherent Transition Radiation</title>]()
SPIE Proceedings [SPIE 30th Annual Technical Symposium - San Diego (Friday 1 August 1986)] X-Rays in Materials Analysis: Novel Applications and Recent Developments - <title>Measurement of X-Ray Dielectric Constants With Coherent Transition Radiation</title>Moran, M. J.; Dahling, B. A.; Piestrup, M. A.; Berman, B. L.; Kephart, J. O.; Rusch, Thomas W. · 1986