![[IEEE 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Vail, Colorado, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Immunity of a virtual instrument to radiated electromagnetic disturbances]()
[IEEE 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Vail, Colorado, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Immunity of a virtual instrument to radiated electromagnetic disturbancesNuccio, S.; Spataro, C.; Tine, G. · 2003