![[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - Efficient Temperature - Dependent Symbolic Sensitivity Analysis and Symbolic Performance Evaluation in Analog Circuit Synthesis]()
[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - Efficient Temperature - Dependent Symbolic Sensitivity Analysis and Symbolic Performance Evaluation in Analog Circuit SynthesisHuiying Yang, ; Vemuri, R. · 2006