![[IEEE 2012 IEEE International Symposium on Electrical Insulation (ISEI) - San Juan, PR, USA (2012.06.10-2012.06.13)] 2012 IEEE International Symposium on Electrical Insulation - Comparative study of PD characteristics and degradation of PET insulation with a self-contained void, void with closed channel and void with vented channel]()
[IEEE 2012 IEEE International Symposium on Electrical Insulation (ISEI) - San Juan, PR, USA (2012.06.10-2012.06.13)] 2012 IEEE International Symposium on Electrical Insulation - Comparative study of PD characteristics and degradation of PET insulation with a self-contained void, void with closed channel and void with vented channelAdhikari, D.; Hepburn, D. M.; Stewart, B. G. · 2012